<?xml version="1.0"?>
<dblp>
<inproceedings key="conf/ets/HuangKHCLK11" mdate="2011-08-25">
<author>Xuan-Lun Huang</author>
<author>Ping-Ying Kang</author>
<author>Jiun-Lang Huang</author>
<author>Yung-Fa Chou</author>
<author>Yung-Pin Lee</author>
<author>Ding-Ming Kwai</author>
<title>A Pre- and Post-bond Self-Testing and Calibration Methodology for SAR ADC Array in 3-D CMOS Imager.</title>
<pages>39-44</pages>
<year>2011</year>
<booktitle>European Test Symposium</booktitle>
<ee>http://doi.ieeecomputersociety.org/10.1109/ETS.2011.39</ee>
<crossref>conf/ets/2011</crossref>
<url>db/conf/ets/ets2011.html#HuangKHCLK11</url>
</inproceedings>
</dblp>
