@inproceedings{DBLP:conf/ets/HosseinabadyLNCBP06,
  author    = {Mohammad Hosseinabady and
               Pejman Lotfi-Kamran and
               Giorgio Di Natale and
               Stefano Di Carlo and
               Alfredo Benso and
               Paolo Prinetto},
  title     = {Single-Event Upset Analysis and Protection in High Speed
               Circuits},
  booktitle = {European Test Symposium},
  year      = {2006},
  pages     = {29-34},
  ee        = {http://doi.ieeecomputersociety.org/10.1109/ETS.2006.41},
  crossref  = {DBLP:conf/ets/2006},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/ets/2006,
  title     = {11th European Test Symposium (ETS 2006), 21-24 May 2006,
               Southhampton, UK},
  booktitle = {European Test Symposium},
  publisher = {IEEE Computer Society},
  year      = {2006},
  isbn      = {0-7695-2566-0},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}