@inproceedings{DBLP:conf/ets/HilscherBRLG08,
author = {Martin Hilscher and
Michael Braun and
Michael Richter and
Andreas Leininger and
Michael G{\"o}ssel},
title = {Accelerated Shift Registers for X-tolerant Test Data Compaction},
booktitle = {European Test Symposium},
year = {2008},
pages = {133-139},
ee = {http://doi.ieeecomputersociety.org/10.1109/ETS.2008.38},
crossref = {DBLP:conf/ets/2008},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/ets/2008,
title = {13th European Test Symposium (ETS 2008), May 25-29, 2008,
Verbania, Italy},
booktitle = {European Test Symposium},
publisher = {IEEE Computer Society},
year = {2008},
isbn = {978-0-7695-3150-2},
bibsource = {DBLP, http://dblp.uni-trier.de}
}