BibTeX record conf/ets/HapkeS12

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@inproceedings{DBLP:conf/ets/HapkeS12,
  author       = {Friedrich Hapke and
                  J{\"{u}}rgen Schl{\"{o}}ffel},
  title        = {Introduction to the defect-oriented cell-aware test methodology for
                  significant reduction of {DPPM} rates},
  booktitle    = {17th {IEEE} European Test Symposium, {ETS} 2012, Annecy, France, May
                  28 - June 1 2012},
  pages        = {1--6},
  publisher    = {{IEEE} Computer Society},
  year         = {2012},
  url          = {https://doi.org/10.1109/ETS.2012.6233046},
  doi          = {10.1109/ETS.2012.6233046},
  timestamp    = {Tue, 28 Apr 2020 11:43:47 +0200},
  biburl       = {https://dblp.org/rec/conf/ets/HapkeS12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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