<?xml version="1.0"?>
<dblp>
<inproceedings key="conf/ets/HanGBC06" mdate="2007-08-28">
<author>Donghoon Han</author>
<author>Shalabh Goyal</author>
<author>Soumendu Bhattacharya</author>
<author>Abhijit Chatterjee</author>
<title>Low Cost Parametric Failure Diagnosis of RF Transceivers.</title>
<pages>205-212</pages>
<year>2006</year>
<crossref>conf/ets/2006</crossref>
<booktitle>European Test Symposium</booktitle>
<ee>http://doi.ieeecomputersociety.org/10.1109/ETS.2006.30</ee>
<url>db/conf/ets/ets2006.html#HanGBC06</url>
</inproceedings>
</dblp>
