@inproceedings{DBLP:conf/ets/HanGBC06,
author = {Donghoon Han and
Shalabh Goyal and
Soumendu Bhattacharya and
Abhijit Chatterjee},
title = {Low Cost Parametric Failure Diagnosis of RF Transceivers},
booktitle = {European Test Symposium},
year = {2006},
pages = {205-212},
ee = {http://doi.ieeecomputersociety.org/10.1109/ETS.2006.30},
crossref = {DBLP:conf/ets/2006},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/ets/2006,
title = {11th European Test Symposium (ETS 2006), 21-24 May 2006,
Southhampton, UK},
booktitle = {European Test Symposium},
publisher = {IEEE Computer Society},
year = {2006},
isbn = {0-7695-2566-0},
bibsource = {DBLP, http://dblp.uni-trier.de}
}