BibTeX
@inproceedings{DBLP:conf/ets/GinezDGLPV07,
author = {O. Ginez and
Jean Michel Daga and
Patrick Girard and
Christian Landrault and
Serge Pravossoudovitch and
Arnaud Virazel},
title = {Electrical Simulation Model of the 2T-FLOTOX Core-Cell for
Defect Injection and Faulty Behavior Prediction in eFlash
Memories},
booktitle = {European Test Symposium},
year = {2007},
pages = {77-84},
ee = {http://doi.ieeecomputersociety.org/10.1109/ETS.2007.20},
crossref = {DBLP:conf/ets/2007},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/ets/2007,
title = {12th European Test Symposium (ETS 2007), 20 May 2007, Freiburg,
Germany},
booktitle = {European Test Symposium},
publisher = {IEEE Computer Society},
year = {2007},
isbn = {978-0-7695-2827-4},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2007-06-18 by Michael Ley (ley@uni-trier.de)