BibTeX record conf/ets/FujibeSMMWMM16

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@inproceedings{DBLP:conf/ets/FujibeSMMWMM16,
  author       = {Tasuku Fujibe and
                  Kazuki Shirahata and
                  Takeshi Mizushima and
                  Hidenobu Matsumura and
                  Daisuke Watanabe and
                  Hiroyuki Mineo and
                  Shin Masuda},
  title        = {An optical/electrical test system for 100Gb/s optical interconnection
                  devices with high volume testing capability},
  booktitle    = {21th {IEEE} European Test Symposium, {ETS} 2016, Amsterdam, Netherlands,
                  May 23-27, 2016},
  pages        = {1--2},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/ETS.2016.7519282},
  doi          = {10.1109/ETS.2016.7519282},
  timestamp    = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl       = {https://dblp.org/rec/conf/ets/FujibeSMMWMM16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}