BibTeX record conf/ets/DengLC18

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@inproceedings{DBLP:conf/ets/DengLC18,
  author       = {Li{-}Wei Deng and
                  Jin{-}Fu Li and
                  Yong{-}Xiao Chen},
  title        = {Modeling and testing comparison faults of memristive ternary content
                  addressable memories},
  booktitle    = {23rd {IEEE} European Test Symposium, {ETS} 2018, Bremen, Germany,
                  May 28 - June 1, 2018},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/ETS.2018.8400695},
  doi          = {10.1109/ETS.2018.8400695},
  timestamp    = {Tue, 17 Oct 2023 15:22:33 +0200},
  biburl       = {https://dblp.org/rec/conf/ets/DengLC18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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