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BibTeX record conf/ets/DengLC18
@inproceedings{DBLP:conf/ets/DengLC18, author = {Li{-}Wei Deng and Jin{-}Fu Li and Yong{-}Xiao Chen}, title = {Modeling and testing comparison faults of memristive ternary content addressable memories}, booktitle = {23rd {IEEE} European Test Symposium, {ETS} 2018, Bremen, Germany, May 28 - June 1, 2018}, pages = {1--6}, publisher = {{IEEE}}, year = {2018}, url = {https://doi.org/10.1109/ETS.2018.8400695}, doi = {10.1109/ETS.2018.8400695}, timestamp = {Tue, 17 Oct 2023 15:22:33 +0200}, biburl = {https://dblp.org/rec/conf/ets/DengLC18.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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