BibTeX record conf/ets/ChuangWC18

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@inproceedings{DBLP:conf/ets/ChuangWC18,
  author       = {Po{-}Yao Chuang and
                  Cheng{-}Wen Wu and
                  Harry H. Chen},
  title        = {Covering hard-to-detect defects by thermal quorum sensing},
  booktitle    = {23rd {IEEE} European Test Symposium, {ETS} 2018, Bremen, Germany,
                  May 28 - June 1, 2018},
  pages        = {1--2},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/ETS.2018.8400705},
  doi          = {10.1109/ETS.2018.8400705},
  timestamp    = {Sun, 06 Oct 2024 21:01:09 +0200},
  biburl       = {https://dblp.org/rec/conf/ets/ChuangWC18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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