BibTeX record conf/ets/ChaudhuriBPKCL19

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@inproceedings{DBLP:conf/ets/ChaudhuriBPKCL19,
  author       = {Arjun Chaudhuri and
                  Sanmitra Banerjee and
                  Heechun Park and
                  Bon Woong Ku and
                  Krishnendu Chakrabarty and
                  Sung Kyu Lim},
  title        = {Built-in Self-Test for Inter-Layer Vias in Monolithic 3D ICs},
  booktitle    = {24th {IEEE} European Test Symposium, {ETS} 2019, Baden-Baden, Germany,
                  May 27-31, 2019},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/ETS.2019.8791515},
  doi          = {10.1109/ETS.2019.8791515},
  timestamp    = {Sun, 02 Oct 2022 16:00:47 +0200},
  biburl       = {https://dblp.org/rec/conf/ets/ChaudhuriBPKCL19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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