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BibTeX record conf/ets/ChaudhuriBPKCL19
@inproceedings{DBLP:conf/ets/ChaudhuriBPKCL19, author = {Arjun Chaudhuri and Sanmitra Banerjee and Heechun Park and Bon Woong Ku and Krishnendu Chakrabarty and Sung Kyu Lim}, title = {Built-in Self-Test for Inter-Layer Vias in Monolithic 3D ICs}, booktitle = {24th {IEEE} European Test Symposium, {ETS} 2019, Baden-Baden, Germany, May 27-31, 2019}, pages = {1--6}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.1109/ETS.2019.8791515}, doi = {10.1109/ETS.2019.8791515}, timestamp = {Sun, 02 Oct 2022 16:00:47 +0200}, biburl = {https://dblp.org/rec/conf/ets/ChaudhuriBPKCL19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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