BibTeX record conf/ets/BahnsenKF21

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@inproceedings{DBLP:conf/ets/BahnsenKF21,
  author       = {Fin Hendrik Bahnsen and
                  Jan Kaiser and
                  G{\"{o}}rschwin Fey},
  title        = {Designing Recurrent Neural Networks for Monitoring Embedded Devices},
  booktitle    = {26th {IEEE} European Test Symposium, {ETS} 2021, Bruges, Belgium,
                  May 24-28, 2021},
  pages        = {1--4},
  publisher    = {{IEEE}},
  year         = {2021},
  url          = {https://doi.org/10.1109/ETS50041.2021.9465460},
  doi          = {10.1109/ETS50041.2021.9465460},
  timestamp    = {Thu, 14 Oct 2021 10:33:58 +0200},
  biburl       = {https://dblp.org/rec/conf/ets/BahnsenKF21.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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