Davide Appello Paolo Bernardi R. Cagliesi M. Giancarlini Michelangelo Grosso Edgar E. Sánchez Matteo Sonza Reorda Automatic Functional Stress Pattern Generation for SoC Reliability Characterization. 93-98 2009 European Test Symposium http://doi.ieeecomputersociety.org/10.1109/ETS.2009.16 conf/ets/2009 db/conf/ets/ets2009.html#AppelloBCGGSR09