BibTeX record conf/ets/AppelloBCGGSR09

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@inproceedings{DBLP:conf/ets/AppelloBCGGSR09,
  author       = {Davide Appello and
                  Paolo Bernardi and
                  R. Cagliesi and
                  M. Giancarlini and
                  Michelangelo Grosso and
                  Edgar E. S{\'{a}}nchez and
                  Matteo Sonza Reorda},
  title        = {Automatic Functional Stress Pattern Generation for SoC Reliability
                  Characterization},
  booktitle    = {14th {IEEE} European Test Symposium, {ETS} 2009, Sevilla, Spain, May
                  25-29, 2009},
  pages        = {93--98},
  publisher    = {{IEEE} Computer Society},
  year         = {2009},
  url          = {https://doi.org/10.1109/ETS.2009.16},
  doi          = {10.1109/ETS.2009.16},
  timestamp    = {Thu, 23 Mar 2023 23:58:22 +0100},
  biburl       = {https://dblp.org/rec/conf/ets/AppelloBCGGSR09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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