BibTeX record conf/ets/AlvesSIDNB11

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@inproceedings{DBLP:conf/ets/AlvesSIDNB11,
  author       = {Nuno Alves and
                  Yiwen Shi and
                  Nicholas Imbriglia and
                  Jennifer Dworak and
                  Kundan Nepal and
                  R. Iris Bahar},
  title        = {Dynamic Test Set Selection Using Implication-Based On-Chip Diagnosis},
  booktitle    = {16th European Test Symposium, {ETS} 2011, Trondheim, Norway, May 23-27,
                  2011},
  pages        = {211},
  publisher    = {{IEEE} Computer Society},
  year         = {2011},
  url          = {https://doi.org/10.1109/ETS.2011.59},
  doi          = {10.1109/ETS.2011.59},
  timestamp    = {Mon, 05 Feb 2024 20:31:45 +0100},
  biburl       = {https://dblp.org/rec/conf/ets/AlvesSIDNB11.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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