BibTeX record conf/etfa/SchwabMKTMFCS22

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@inproceedings{DBLP:conf/etfa/SchwabMKTMFCS22,
  author       = {Maximilian Schwab and
                  Charles Madeline{-}D{\'{e}}rou and
                  Steffen Klarmann and
                  Nils Thielen and
                  Sven Meier and
                  J{\"{o}}rg Franke and
                  Sandan Chintanippu and
                  Wilhelm Stork},
  title        = {Multi-Model Machine Learning based Industrial Vision Framework for
                  Assembly Part Quality Control},
  booktitle    = {27th {IEEE} International Conference on Emerging Technologies and
                  Factory Automation, {ETFA} 2022, Stuttgart, Germany, September 6-9,
                  2022},
  pages        = {1--4},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/ETFA52439.2022.9921587},
  doi          = {10.1109/ETFA52439.2022.9921587},
  timestamp    = {Mon, 05 Feb 2024 20:28:56 +0100},
  biburl       = {https://dblp.org/rec/conf/etfa/SchwabMKTMFCS22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}