BibTeX record conf/etfa/PisaMVV22

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@inproceedings{DBLP:conf/etfa/PisaMVV22,
  author       = {Ivan Pisa and
                  Antoni Morell and
                  Jos{\'{e}} L{\'{o}}pez Vicario and
                  Ram{\'{o}}n Vilanova},
  title        = {Transfer Learning Suitability Metric for ANN-based Industrial Controllers},
  booktitle    = {27th {IEEE} International Conference on Emerging Technologies and
                  Factory Automation, {ETFA} 2022, Stuttgart, Germany, September 6-9,
                  2022},
  pages        = {1--8},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/ETFA52439.2022.9921529},
  doi          = {10.1109/ETFA52439.2022.9921529},
  timestamp    = {Mon, 26 Jun 2023 20:43:44 +0200},
  biburl       = {https://dblp.org/rec/conf/etfa/PisaMVV22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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