BibTeX record conf/etfa/Gonzalez-AbreuS20

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@inproceedings{DBLP:conf/etfa/Gonzalez-AbreuS20,
  author       = {Artvin Darien Gonzalez{-}Abreu and
                  Juan Jos{\'{e}} Saucedo{-}Dorantes and
                  Roque Alfredo Osornio{-}Rios and
                  Francisco Arellano{-}Espitia and
                  Miguel Delgado Prieto},
  title        = {Deep Learning based Condition Monitoring approach applied to Power
                  Quality},
  booktitle    = {25th {IEEE} International Conference on Emerging Technologies and
                  Factory Automation, {ETFA} 2020, Vienna, Austria, September 8-11,
                  2020},
  pages        = {1427--1430},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/ETFA46521.2020.9212076},
  doi          = {10.1109/ETFA46521.2020.9212076},
  timestamp    = {Fri, 16 Oct 2020 08:33:50 +0200},
  biburl       = {https://dblp.org/rec/conf/etfa/Gonzalez-AbreuS20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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