BibTeX record conf/etfa/BraunischLWRVOK23

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@inproceedings{DBLP:conf/etfa/BraunischLWRVOK23,
  author       = {Nico Braunisch and
                  Robert Lehmann and
                  Martin Wollschlaeger and
                  Marko Ristin and
                  Hans Wernher van de Venn and
                  Bj{\"{o}}rn Otto and
                  Tobias Kleinert},
  title        = {Maturity Evaluation of SDKs for {I4.0} Digital Twins},
  booktitle    = {28th {IEEE} International Conference on Emerging Technologies and
                  Factory Automation, {ETFA} 2023, Sinaia, Romania, September 12-15,
                  2023},
  pages        = {1--8},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/ETFA54631.2023.10275719},
  doi          = {10.1109/ETFA54631.2023.10275719},
  timestamp    = {Mon, 23 Oct 2023 09:15:55 +0200},
  biburl       = {https://dblp.org/rec/conf/etfa/BraunischLWRVOK23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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