BibTeX record conf/essderc/SuLFXWCCHH23

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@inproceedings{DBLP:conf/essderc/SuLFXWCCHH23,
  author       = {Chang Su and
                  Zhongxin Liang and
                  Zhiyuan Fu and
                  Shaodi Xu and
                  Kaifeng Wang and
                  Puyang Cai and
                  Liang Chen and
                  Ru Huang and
                  Qianqian Huang},
  title        = {New Insights into Read Current Margin and Memory Window of HfO2-based
                  Ferroelectric {FET} with Re-exploration of the Role of Ferroelectric
                  Dynamics and Interface Charges during Readout},
  booktitle    = {53rd {IEEE} European Solid-State Device Research Conference, {ESSDERC}
                  2023, Lisbon, Portugal, September 11-14, 2023},
  pages        = {89--92},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/ESSDERC59256.2023.10268479},
  doi          = {10.1109/ESSDERC59256.2023.10268479},
  timestamp    = {Mon, 03 Jun 2024 16:30:04 +0200},
  biburl       = {https://dblp.org/rec/conf/essderc/SuLFXWCCHH23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}