BibTeX record conf/essderc/SantS17

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@inproceedings{DBLP:conf/essderc/SantS17,
  author       = {Saurabh Sant and
                  Andreas Schenk},
  title        = {Modeling the effect of surface roughness on the performance of line
                  tunnel FETs},
  booktitle    = {47th European Solid-State Device Research Conference, {ESSDERC} 2017,
                  Leuven, Belgium, September 11-14, 2017},
  pages        = {50--53},
  publisher    = {{IEEE}},
  year         = {2017},
  url          = {https://doi.org/10.1109/ESSDERC.2017.8066589},
  doi          = {10.1109/ESSDERC.2017.8066589},
  timestamp    = {Wed, 16 Oct 2019 14:14:50 +0200},
  biburl       = {https://dblp.org/rec/conf/essderc/SantS17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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