BibTeX record conf/essderc/PuglisiCKLP16

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@inproceedings{DBLP:conf/essderc/PuglisiCKLP16,
  author       = {Francesco Maria Puglisi and
                  Felipe Costantini and
                  Ben Kaczer and
                  Luca Larcher and
                  Paolo Pavan},
  title        = {Probing defects generation during stress in high-{\(\kappa\)}/metal
                  gate FinFETs by random telegraph noise characterization},
  booktitle    = {46th European Solid-State Device Research Conference, {ESSDERC} 2016,
                  Lausanne, Switzerland, September 12-15, 2016},
  pages        = {252--255},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/ESSDERC.2016.7599633},
  doi          = {10.1109/ESSDERC.2016.7599633},
  timestamp    = {Wed, 07 Dec 2022 23:14:02 +0100},
  biburl       = {https://dblp.org/rec/conf/essderc/PuglisiCKLP16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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