BibTeX record conf/essderc/PradeepKPJSGJG18

download as .bib file

@inproceedings{DBLP:conf/essderc/PradeepKPJSGJG18,
  author       = {Krishna Pradeep and
                  Theano A. Karatsori and
                  Thierry Poiroux and
                  Andre Juge and
                  Patrick Scheer and
                  Gilles Gouget and
                  Emmanuel Josse and
                  G{\'{e}}rard Ghibaudo},
  title        = {Analysis of Gate Current Wafer Level Variability in Advanced {FD-SOI}
                  MOSFETs},
  booktitle    = {48th European Solid-State Device Research Conference, {ESSDERC} 2018,
                  Dresden, Germany, September 3-6, 2018},
  pages        = {242--245},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/ESSDERC.2018.8486847},
  doi          = {10.1109/ESSDERC.2018.8486847},
  timestamp    = {Mon, 03 Jan 2022 22:21:42 +0100},
  biburl       = {https://dblp.org/rec/conf/essderc/PradeepKPJSGJG18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.