BibTeX record conf/essderc/NigamKSRC17

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@inproceedings{DBLP:conf/essderc/NigamKSRC17,
  author       = {Tanya Nigam and
                  Andreas Kerber and
                  Tian Shen and
                  Rakesh Ranjan and
                  Linjun Cao},
  title        = {Material and device innovation impact on reliability for scaled {CMOS}
                  technologies},
  booktitle    = {47th European Solid-State Device Research Conference, {ESSDERC} 2017,
                  Leuven, Belgium, September 11-14, 2017},
  pages        = {134--139},
  publisher    = {{IEEE}},
  year         = {2017},
  url          = {https://doi.org/10.1109/ESSDERC.2017.8066610},
  doi          = {10.1109/ESSDERC.2017.8066610},
  timestamp    = {Thu, 12 Jan 2023 09:26:22 +0100},
  biburl       = {https://dblp.org/rec/conf/essderc/NigamKSRC17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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