BibTeX record conf/essderc/MaedaMTY18

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@inproceedings{DBLP:conf/essderc/MaedaMTY18,
  author       = {Kazuki Maeda and
                  Shinpei Matsuda and
                  Ken Takeuchi and
                  Ryutaro Yasuhara},
  title        = {Observation and Analysis of Bit-by-Bit Cell Current Variation During
                  Data-Retention of TaOx-based ReRAM},
  booktitle    = {48th European Solid-State Device Research Conference, {ESSDERC} 2018,
                  Dresden, Germany, September 3-6, 2018},
  pages        = {46--49},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/ESSDERC.2018.8486913},
  doi          = {10.1109/ESSDERC.2018.8486913},
  timestamp    = {Wed, 16 Oct 2019 14:14:50 +0200},
  biburl       = {https://dblp.org/rec/conf/essderc/MaedaMTY18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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