![](https://dblp.uni-trier.de/img/logo.ua.320x120.png)
![](https://dblp.uni-trier.de/img/dropdown.dark.16x16.png)
![](https://dblp.uni-trier.de/img/peace.dark.16x16.png)
Остановите войну!
for scientists:
![search dblp search dblp](https://dblp.uni-trier.de/img/search.dark.16x16.png)
![search dblp](https://dblp.uni-trier.de/img/search.dark.16x16.png)
default search action
BibTeX record conf/essderc/IoannidisHTPDG14
@inproceedings{DBLP:conf/essderc/IoannidisHTPDG14, author = {Eleftherios G. Ioannidis and S{\'{e}}bastien Haendler and Christoforos G. Theodorou and Nicolas Planes and C. A. Dimitriadis and G{\'{e}}rard Ghibaudo}, title = {Statistical analysis of dynamic variability in 28nm {FD-SOI} MOSFETs}, booktitle = {44th European Solid State Device Research Conference, {ESSDERC} 2014, Venice Lido, Italy, September 22-26, 2014}, pages = {214--217}, publisher = {{IEEE}}, year = {2014}, url = {https://doi.org/10.1109/ESSDERC.2014.6948798}, doi = {10.1109/ESSDERC.2014.6948798}, timestamp = {Sat, 30 Sep 2023 09:40:27 +0200}, biburl = {https://dblp.org/rec/conf/essderc/IoannidisHTPDG14.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
![](https://dblp.uni-trier.de/img/cog.dark.24x24.png)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.