BibTeX record conf/essderc/ByunKMSSK22

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@inproceedings{DBLP:conf/essderc/ByunKMSSK22,
  author       = {Dong{-}Wook Byun and
                  Min{-}Yeong Kim and
                  Soo{-}Young Moon and
                  Myeongcheol Shin and
                  Michael A. Schweitz and
                  Sang{-}Mo Koo},
  title        = {Effect of Post Annealing on the Electrical Characteristics and Deep
                  Level Defects of Ga2O3/SiC Heterojunction Diodes},
  booktitle    = {52nd {IEEE} European Solid-State Device Research Conference, {ESSDERC}
                  2022, Milan, Italy, September 19-22, 2022},
  pages        = {249--252},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/ESSDERC55479.2022.9947098},
  doi          = {10.1109/ESSDERC55479.2022.9947098},
  timestamp    = {Thu, 17 Aug 2023 10:05:55 +0200},
  biburl       = {https://dblp.org/rec/conf/essderc/ByunKMSSK22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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