BibTeX record conf/essderc/AwanoHS14

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@inproceedings{DBLP:conf/essderc/AwanoHS14,
  author       = {Hiromitsu Awano and
                  Masayuki Hiromoto and
                  Takashi Sato},
  title        = {Variability in device degradations: Statistical observation of {NBTI}
                  for 3996 transistors},
  booktitle    = {44th European Solid State Device Research Conference, {ESSDERC} 2014,
                  Venice Lido, Italy, September 22-26, 2014},
  pages        = {218--221},
  publisher    = {{IEEE}},
  year         = {2014},
  url          = {https://doi.org/10.1109/ESSDERC.2014.6948799},
  doi          = {10.1109/ESSDERC.2014.6948799},
  timestamp    = {Mon, 17 Jun 2024 15:19:47 +0200},
  biburl       = {https://dblp.org/rec/conf/essderc/AwanoHS14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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