BibTeX record conf/esscirc/OUchiELNMITYSKS10

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@inproceedings{DBLP:conf/esscirc/OUchiELNMITYSKS10,
  author       = {Shin{-}ichi O'Uchi and
                  Kazuhiko Endo and
                  Yongxun Liu and
                  Tadashi Nakagawa and
                  Takashi Matsukawa and
                  Yuki Ishikawa and
                  Junichi Tsukada and
                  Hiromi Yamauchi and
                  Toshihiro Sekigawa and
                  Hanpei Koike and
                  Kunihiro Sakamoto and
                  Meishoku Masahara},
  title        = {0.5V FinFET {SRAM} with dynamic threshold control of pass gates for
                  salvaging malfunctioned bits},
  booktitle    = {36th European Solid-State Circuits Conference, {ESSCIRC} 2010, Sevilla,
                  Spain, September 13-17, 2010},
  pages        = {474--477},
  publisher    = {{IEEE}},
  year         = {2010},
  url          = {https://doi.org/10.1109/ESSCIRC.2010.5619746},
  doi          = {10.1109/ESSCIRC.2010.5619746},
  timestamp    = {Mon, 09 Aug 2021 14:54:02 +0200},
  biburl       = {https://dblp.org/rec/conf/esscirc/OUchiELNMITYSKS10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}