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BibTeX record conf/esscirc/OUchiELNMITYSKS10
@inproceedings{DBLP:conf/esscirc/OUchiELNMITYSKS10, author = {Shin{-}ichi O'Uchi and Kazuhiko Endo and Yongxun Liu and Tadashi Nakagawa and Takashi Matsukawa and Yuki Ishikawa and Junichi Tsukada and Hiromi Yamauchi and Toshihiro Sekigawa and Hanpei Koike and Kunihiro Sakamoto and Meishoku Masahara}, title = {0.5V FinFET {SRAM} with dynamic threshold control of pass gates for salvaging malfunctioned bits}, booktitle = {36th European Solid-State Circuits Conference, {ESSCIRC} 2010, Sevilla, Spain, September 13-17, 2010}, pages = {474--477}, publisher = {{IEEE}}, year = {2010}, url = {https://doi.org/10.1109/ESSCIRC.2010.5619746}, doi = {10.1109/ESSCIRC.2010.5619746}, timestamp = {Mon, 09 Aug 2021 14:54:02 +0200}, biburl = {https://dblp.org/rec/conf/esscirc/OUchiELNMITYSKS10.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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