BibTeX record conf/esscirc/FujiiSNMS08

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@inproceedings{DBLP:conf/esscirc/FujiiSNMS08,
  author       = {Masako Fujii and
                  Hiroaki Suzuki and
                  Hiromi Notani and
                  Hiroshi Makino and
                  Hirofumi Shinohara},
  editor       = {William Redman{-}White and
                  Anthony J. Walton},
  title        = {On-chip leakage monitor circuit to scan optimal reverse bias voltage
                  for adaptive body-bias circuit under gate induced drain leakage effect},
  booktitle    = {{ESSCIRC} 2008 - 34th European Solid-State Circuits Conference, Edinburgh,
                  Scotland, UK, 15-19 September 2008},
  pages        = {258--261},
  publisher    = {{IEEE}},
  year         = {2008},
  url          = {https://doi.org/10.1109/ESSCIRC.2008.4681841},
  doi          = {10.1109/ESSCIRC.2008.4681841},
  timestamp    = {Mon, 09 Aug 2021 14:54:02 +0200},
  biburl       = {https://dblp.org/rec/conf/esscirc/FujiiSNMS08.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}