BibTeX record conf/esem/Storrle16

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@inproceedings{DBLP:conf/esem/Storrle16,
  author    = {Harald St{\"{o}}rrle},
  title     = {Diagram Size vs. Layout Flaws: Understanding Quality Factors of {UML}
               Diagrams},
  booktitle = {Proceedings of the 10th {ACM/IEEE} International Symposium on Empirical
               Software Engineering and Measurement, {ESEM} 2016, Ciudad Real, Spain,
               September 8-9, 2016},
  pages     = {31:1--31:10},
  year      = {2016},
  crossref  = {DBLP:conf/esem/2016},
  url       = {http://doi.acm.org/10.1145/2961111.2962609},
  doi       = {10.1145/2961111.2962609},
  timestamp = {Thu, 22 Sep 2016 17:24:33 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/esem/Storrle16},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/esem/2016,
  title     = {Proceedings of the 10th {ACM/IEEE} International Symposium on Empirical
               Software Engineering and Measurement, {ESEM} 2016, Ciudad Real, Spain,
               September 8-9, 2016},
  publisher = {{ACM}},
  year      = {2016},
  url       = {http://doi.acm.org/10.1145/2961111},
  doi       = {10.1145/2961111},
  isbn      = {978-1-4503-4427-2},
  timestamp = {Thu, 22 Sep 2016 17:02:16 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/esem/2016},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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