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BibTeX record conf/esem/ShahMT12
@inproceedings{DBLP:conf/esem/ShahMT12, author = {Syed Muhammad Ali Shah and Maurizio Morisio and Marco Torchiano}, editor = {Per Runeson and Martin H{\"{o}}st and Emilia Mendes and Anneliese Amschler Andrews and Rachel Harrison}, title = {The impact of process maturity on defect density}, booktitle = {2012 {ACM-IEEE} International Symposium on Empirical Software Engineering and Measurement, {ESEM} '12, Lund, Sweden - September 19 - 20, 2012}, pages = {315--318}, publisher = {{ACM}}, year = {2012}, url = {https://doi.org/10.1145/2372251.2372308}, doi = {10.1145/2372251.2372308}, timestamp = {Wed, 16 Oct 2019 14:14:52 +0200}, biburl = {https://dblp.org/rec/conf/esem/ShahMT12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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