BibTeX record conf/esem/MeneelySMTMS13

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@inproceedings{DBLP:conf/esem/MeneelySMTMS13,
  author       = {Andrew Meneely and
                  Harshavardhan Srinivasan and
                  Ayemi Musa and
                  Alberto Rodriguez Tejeda and
                  Matthew Mokary and
                  Brian Spates},
  title        = {When a Patch Goes Bad: Exploring the Properties of Vulnerability-Contributing
                  Commits},
  booktitle    = {2013 {ACM} / {IEEE} International Symposium on Empirical Software
                  Engineering and Measurement, Baltimore, Maryland, USA, October 10-11,
                  2013},
  pages        = {65--74},
  publisher    = {{IEEE} Computer Society},
  year         = {2013},
  url          = {https://doi.org/10.1109/ESEM.2013.19},
  doi          = {10.1109/ESEM.2013.19},
  timestamp    = {Fri, 24 Mar 2023 00:05:00 +0100},
  biburl       = {https://dblp.org/rec/conf/esem/MeneelySMTMS13.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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