BibTeX record conf/esem/LiuZYLX17

• > Home > conf/esem/LiuZYLX17

@inproceedings{DBLP:conf/esem/LiuZYLX17,
  author       = {Jinping Liu and
                  Yuming Zhou and
                  Yibiao Yang and
                  Hongmin Lu and
                  Baowen Xu},
  editor       = {Ayse Bener and
                  Burak Turhan and
                  Stefan Biffl},
  title        = {Code Churn: {A} Neglected Metric in Effort-Aware Just-in-Time Defect
                  Prediction},
  booktitle    = {2017 {ACM/IEEE} International Symposium on Empirical Software Engineering
                  and Measurement, {ESEM} 2017, Toronto, ON, Canada, November 9-10,
                  2017},
  pages        = {11--19},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/ESEM.2017.8},
  doi          = {10.1109/ESEM.2017.8},
  timestamp    = {Fri, 24 Mar 2023 00:05:00 +0100},
  biburl       = {https://dblp.org/rec/conf/esem/LiuZYLX17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}