Yasutaka Kamei Akito Monden Shinsuke Matsumoto Takeshi Kakimoto Ken-ichi Matsumoto The Effects of Over and Under Sampling on Fault-prone Module Detection. 196-204 2007 conf/esem/2007 ESEM http://doi.ieeecomputersociety.org/10.1109/ESEM.2007.80 db/conf/esem/esem2007.html#KameiMMKM07