DBLP Record 'conf/esem/KameiMMKM07'

BibTeX

@inproceedings{DBLP:conf/esem/KameiMMKM07,
  author    = {Yasutaka Kamei and
               Akito Monden and
               Shinsuke Matsumoto and
               Takeshi Kakimoto and
               Ken-ichi Matsumoto},
  title     = {The Effects of Over and Under Sampling on Fault-prone Module
               Detection},
  booktitle = {ESEM},
  year      = {2007},
  pages     = {196-204},
  ee        = {http://doi.ieeecomputersociety.org/10.1109/ESEM.2007.80},
  crossref  = {DBLP:conf/esem/2007},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/esem/2007,
  title     = {Proceedings of the First International Symposium on Empirical
               Software Engineering and Measurement, ESEM 2007, September
               20-21, 2007, Madrid, Spain},
  booktitle = {ESEM},
  publisher = {IEEE Computer Society},
  year      = {2007},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}