BibTeX record conf/eit/XingCG08

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@inproceedings{DBLP:conf/eit/XingCG08,
  author       = {Hanqing Xing and
                  Degang Chen and
                  Randall L. Geiger},
  title        = {On-chip at-speed linearity testing of high-resolution high-speed DACs
                  using {DDEM} ADCs with dithering},
  booktitle    = {2008 {IEEE} International Conference on Electro/Information Technology,
                  {EIT} 2008, held at Iowa State University, Ames, Iowa, USA, May 18-20,
                  2008},
  pages        = {117--122},
  publisher    = {{IEEE}},
  year         = {2008},
  url          = {https://doi.org/10.1109/EIT.2008.4554278},
  doi          = {10.1109/EIT.2008.4554278},
  timestamp    = {Tue, 26 Jul 2022 14:45:20 +0200},
  biburl       = {https://dblp.org/rec/conf/eit/XingCG08.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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