BibTeX record conf/ei-maap/ObeinAGL15

• > Home > conf/ei-maap/ObeinAGL15

@inproceedings{DBLP:conf/ei-maap/ObeinAGL15,
  author       = {Ga{\"{e}}l Obein and
                  Jan Audenaert and
                  Guillaume Ged and
                  Fr{\'{e}}d{\'{e}}ric B. Leloup},
  editor       = {Maria V. Ortiz Segovia and
                  Philipp Urban and
                  Francisco H. Imai},
  title        = {Metrological issues related to {BRDF} measurements around the specular
                  direction in the particular case of glossy surfaces},
  booktitle    = {Measuring, Modeling, and Reproducing Material Appearance 2015, San
                  Francisco, California, United States, February 9-10, 2015},
  series       = {{SPIE} Proceedings},
  volume       = {9398},
  pages        = {93980D},
  publisher    = {{SPIE}},
  year         = {2015},
  url          = {https://doi.org/10.1117/12.2082518},
  doi          = {10.1117/12.2082518},
  timestamp    = {Fri, 08 Sep 2023 21:18:18 +0200},
  biburl       = {https://dblp.org/rec/conf/ei-maap/ObeinAGL15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}