Ondrej Novák Jirí Zahrádka Zdenek Plíva COMPAS - Compressed Test Pattern Sequencer for Scan Based Circuits. 403-414 http://dx.doi.org/10.1007/11408901_30 2005 conf/edcc/2005 EDCC db/conf/edcc/edcc2005.html#NovakZP05