BibTeX record conf/ecctd/ZhangPZSY11

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@inproceedings{DBLP:conf/ecctd/ZhangPZSY11,
  author       = {Bo Zhang and
                  Weiwei Pan and
                  Yongjun Zheng and
                  Zheng Shi and
                  Xiaolang Yan},
  title        = {A fully automated large-scale addressable test chip design with high
                  reliability},
  booktitle    = {20th European Conference on Circuit Theory and Design, {ECCTD} 2011,
                  Linkoping, Sweden, Aug. 29-31, 2011},
  pages        = {61--64},
  publisher    = {{IEEE}},
  year         = {2011},
  url          = {https://doi.org/10.1109/ECCTD.2011.6043609},
  doi          = {10.1109/ECCTD.2011.6043609},
  timestamp    = {Fri, 28 Jul 2023 15:16:38 +0200},
  biburl       = {https://dblp.org/rec/conf/ecctd/ZhangPZSY11.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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