BibTeX record conf/ecctd/PareschiRS07

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@inproceedings{DBLP:conf/ecctd/PareschiRS07,
  author       = {Fabio Pareschi and
                  Riccardo Rovatti and
                  Gianluca Setti},
  title        = {Second-level testing revisited and applications to {NIST} {SP800-22}},
  booktitle    = {18th European Conference on Circuit Theory and Design, {ECCTD} 2007,
                  Seville, Spain, August 26-30, 2007},
  pages        = {627--630},
  publisher    = {{IEEE}},
  year         = {2007},
  url          = {https://doi.org/10.1109/ECCTD.2007.4529674},
  doi          = {10.1109/ECCTD.2007.4529674},
  timestamp    = {Mon, 09 Aug 2021 01:32:18 +0200},
  biburl       = {https://dblp.org/rec/conf/ecctd/PareschiRS07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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