BibTeX record conf/ecctd/NakuraTFIKA09

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@inproceedings{DBLP:conf/ecctd/NakuraTFIKA09,
  author       = {Toru Nakura and
                  Yutaro Tatemura and
                  G{\"{o}}rschwin Fey and
                  Makoto Ikeda and
                  Satoshi Komatsu and
                  Kunihiro Asada},
  title        = {SAT-based {ATPG} testing of inter- and intra-gate bridging faults},
  booktitle    = {19th European Conference on Circuit Theory and Design, {ECCTD} 2009,
                  Antalya, Turkey, August 23-27, 2009},
  pages        = {643--646},
  publisher    = {{IEEE}},
  year         = {2009},
  url          = {https://doi.org/10.1109/ECCTD.2009.5275065},
  doi          = {10.1109/ECCTD.2009.5275065},
  timestamp    = {Tue, 29 Dec 2020 18:38:24 +0100},
  biburl       = {https://dblp.org/rec/conf/ecctd/NakuraTFIKA09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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