BibTeX record conf/dtis/FarayolaBCSRC21

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@inproceedings{DBLP:conf/dtis/FarayolaBCSRC21,
  author       = {Praise O. Farayola and
                  Isaac Bruce and
                  Shravan K. Chaganti and
                  Abalhassan Sheikh and
                  Srivaths Ravi and
                  Degang Chen},
  title        = {Massive Multisite Variability-Aware Die Distribution Estimation for
                  Analog/Mixed-Signal Circuits Test Validation},
  booktitle    = {16th International Conference on Design {\&} Technology of Integrated
                  Systems in Nanoscale Era, {DTIS} 2021, Montpellier, France, June 28-30,
                  2021},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2021},
  url          = {https://doi.org/10.1109/DTIS53253.2021.9505144},
  doi          = {10.1109/DTIS53253.2021.9505144},
  timestamp    = {Tue, 26 Jul 2022 14:45:20 +0200},
  biburl       = {https://dblp.org/rec/conf/dtis/FarayolaBCSRC21.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}