BibTeX record conf/dtis/BenvenutiBFCCPT19

download as .bib file

@inproceedings{DBLP:conf/dtis/BenvenutiBFCCPT19,
  author       = {Lorenzo Benvenuti and
                  Paolo Bruschi and
                  Luca Fanucci and
                  Raffaele Coppeta and
                  Sara Carniello and
                  Luigi Di Piro and
                  Francesco Tinfena},
  title        = {Modelling and measurements of thermomechanical stress induced drift
                  on polysilicon resistors with different layout},
  booktitle    = {14th International Conference on Design {\&} Technology of Integrated
                  Systems In Nanoscale Era, {DTIS} 2019, Mykonos, Greece, April 16-18,
                  2019},
  pages        = {1--5},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/DTIS.2019.8734970},
  doi          = {10.1109/DTIS.2019.8734970},
  timestamp    = {Sat, 30 Sep 2023 09:39:09 +0200},
  biburl       = {https://dblp.org/rec/conf/dtis/BenvenutiBFCCPT19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.