BibTeX record conf/dsn/MaJ20

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@inproceedings{DBLP:conf/dsn/MaJ20,
  author       = {Dongning Ma and
                  Xun Jiao},
  title        = {A Machine Learning-Based Error Model of Voltage-Scaled Circuits},
  booktitle    = {50th Annual {IEEE-IFIP} International Conference on Dependable Systems
                  and Networks, {DSN} 2020, Valencia, Spain, June 29 - July 2, 2020
                  - Supplemental Volume},
  pages        = {89--91},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/DSN-S50200.2020.00046},
  doi          = {10.1109/DSN-S50200.2020.00046},
  timestamp    = {Thu, 13 Aug 2020 14:36:39 +0200},
  biburl       = {https://dblp.org/rec/conf/dsn/MaJ20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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