BibTeX
@inproceedings{DBLP:conf/dsd/RaikUKK07,
author = {Jaan Raik and
Raimund Ubar and
Anna Krivenko and
Margus Kruus},
title = {Hierarchical Identification of Untestable Faults in Sequential
Circuits},
booktitle = {DSD},
year = {2007},
pages = {668-671},
ee = {http://dx.doi.org/10.1109/DSD.2007.4341539},
crossref = {DBLP:conf/dsd/2007},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/dsd/2007,
title = {Tenth Euromicro Conference on Digital System Design: Architectures,
Methods and Tools (DSD 2007), 29-31 August 2007, L{\"u}beck,
Germany},
booktitle = {DSD},
publisher = {IEEE},
year = {2007},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2008-07-09 by Michael Ley (ley@uni-trier.de)