DBLP BibTeX Record 'conf/dsd/PleskaczJRRUK08'

@inproceedings{DBLP:conf/dsd/PleskaczJRRUK08,
  author    = {Witold A. Pleskacz and
               Maksim Jenihhin and
               Jaan Raik and
               Michal Rakowski and
               Raimund Ubar and
               Wieslaw Kuzmicz},
  title     = {Hierarchical Analysis of Short Defects between Metal Lines
               in CMOS IC},
  booktitle = {DSD},
  year      = {2008},
  pages     = {729-734},
  ee        = {http://dx.doi.org/10.1109/DSD.2008.98},
  crossref  = {DBLP:conf/dsd/2008},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/dsd/2008,
  editor    = {Luca Fanucci},
  title     = {11th Euromicro Conference on Digital System Design: Architectures,
               Methods and Tools, DSD 2008, Parma, Italy, September 3-5,
               2008},
  booktitle = {DSD},
  publisher = {IEEE},
  year      = {2008},
  isbn      = {978-0-7695-3277-6},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

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