BibTeX record conf/dsa/HuWKK18

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@inproceedings{DBLP:conf/dsa/HuWKK18,
  author       = {Linghuan Hu and
                  W. Eric Wong and
                  D. Richard Kuhn and
                  Raghu Kacker},
  title        = {MCDC-Star: {A} White-Box Based Automated Test Generation for High
                  {MC/DC} Coverage},
  booktitle    = {5th International Conference on Dependable Systems and Their Applications,
                  {DSA} 2018, Dalian, China, September 22-23, 2018},
  pages        = {102--112},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/DSA.2018.00027},
  doi          = {10.1109/DSA.2018.00027},
  timestamp    = {Mon, 09 Aug 2021 01:32:18 +0200},
  biburl       = {https://dblp.org/rec/conf/dsa/HuWKK18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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