BibTeX record conf/drc/XueRHCBZJSKRL18

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@inproceedings{DBLP:conf/drc/XueRHCBZJSKRL18,
  author       = {Hao Xue and
                  Towhidur Razzak and
                  Seongmo Hwang and
                  Antwon Coleman and
                  Sanyam Bajaj and
                  Yuewei Zhang and
                  Zane Jamal{-}Eddin and
                  Shahadat Hasan Sohel and
                  Asif Khan and
                  Siddharth Rajan and
                  Wu Lu},
  title        = {All {MOCVD} grown 250 nm gate length Al0.70Ga0.30N MESFETs},
  booktitle    = {76th Device Research Conference, {DRC} 2018, Santa Barbara, CA, USA,
                  June 24-27, 2018},
  pages        = {1--2},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/DRC.2018.8442167},
  doi          = {10.1109/DRC.2018.8442167},
  timestamp    = {Fri, 06 Sep 2024 14:03:52 +0200},
  biburl       = {https://dblp.org/rec/conf/drc/XueRHCBZJSKRL18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}