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BibTeX record conf/drc/WuATWS18
@inproceedings{DBLP:conf/drc/WuATWS18, author = {Ting Wu and Abdullah Alharbi and Takashi Taniguchi and Kenji Watanabe and Davood Shahrjerdi}, title = {Effects of single vacancy defects on 1/f noise in grapbene/b-BN FETs}, booktitle = {76th Device Research Conference, {DRC} 2018, Santa Barbara, CA, USA, June 24-27, 2018}, pages = {1--2}, publisher = {{IEEE}}, year = {2018}, url = {https://doi.org/10.1109/DRC.2018.8442196}, doi = {10.1109/DRC.2018.8442196}, timestamp = {Thu, 21 Apr 2022 12:20:58 +0200}, biburl = {https://dblp.org/rec/conf/drc/WuATWS18.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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