BibTeX record conf/drc/WuATWS18

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@inproceedings{DBLP:conf/drc/WuATWS18,
  author       = {Ting Wu and
                  Abdullah Alharbi and
                  Takashi Taniguchi and
                  Kenji Watanabe and
                  Davood Shahrjerdi},
  title        = {Effects of single vacancy defects on 1/f noise in grapbene/b-BN FETs},
  booktitle    = {76th Device Research Conference, {DRC} 2018, Santa Barbara, CA, USA,
                  June 24-27, 2018},
  pages        = {1--2},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/DRC.2018.8442196},
  doi          = {10.1109/DRC.2018.8442196},
  timestamp    = {Thu, 21 Apr 2022 12:20:58 +0200},
  biburl       = {https://dblp.org/rec/conf/drc/WuATWS18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}